SPEDEN: Reconstructing single particles from their diffraction patterns

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 60, Issue 4, 2004, Pages 294-305

  Hau Riege, Stefan P ^a   Szoke, Hanna ^a   Chapman, Henry N ^a   Szoke, Abraham ^a   Marchesini, Stefano ^a   Noy, Alexander ^a   He, Haifeng ^b   Howells, Malcolm ^b   Weierstall, Uwe ^c   Spence, John C H ^c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER PROGRAM; ELECTRON; EVALUATION; IMAGE PROCESSING; MATHEMATICS; METHODOLOGY; X RAY DIFFRACTION;

ALGORITHMS; ELECTRONS; IMAGE PROCESSING, COMPUTER-ASSISTED; MATHEMATICS; SOFTWARE; X-RAY DIFFRACTION;

EID: 6944222761     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767304010293     Document Type: Article

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