메뉴 건너뛰기




Volumn 9, Issue 4, 2007, Pages 875-880

Low pressure plasma-jet systems and their application for deposition of ceramic thin films

Author keywords

Ceramic thin films; Langmuir probe; Plasma jet; STO and BSTO layers

Indexed keywords

BARIUM; BARIUM METALLOGRAPHY; BARIUM TITANATE; DEPOSITION; ELECTRON PROBE MICROANALYSIS; ELECTRON TEMPERATURE; ELECTRONS; FREE RADICALS; LANGMUIR PROBES; NEUTRONS; NOZZLES; OPTICAL EMISSION SPECTROSCOPY; PEROVSKITE; PLASMA JETS; SILICON; STRONTIUM; STRONTIUM TITANATES; SUBSTRATES;

EID: 38549141207     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (17)
  • 11
    • 0041697814 scopus 로고    scopus 로고
    • Langmuir probe diagnostics of low-temperature plasmas
    • R. Hippler et al. Eds, Wiley-VCH, Berlin etc, ISBN 3-527-28887-2, p
    • S. Pfau, M. Tichý, Langmuir probe diagnostics of low-temperature plasmas, in Low Temperature Plasma Physics, R. Hippler et al. Eds., Wiley-VCH, Berlin etc., 2001, ISBN 3-527-28887-2, p. 131.
    • (2001) Low Temperature Plasma Physics , pp. 131
    • Pfau, S.1    Tichý, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.