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Volumn , Issue , 2004, Pages 465-472

A review of creep fatigue failure models in solder material - Simplified use of a continuous damage mechanical approach

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; CYCLIC LOADS; FATIGUE OF MATERIALS; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); KINEMATICS; LEAD; NUCLEATION; NUMERICAL METHODS; SOLDERING ALLOYS; STRAIN RATE; THERMAL EFFECTS; THERMAL EXPANSION; THERMOMECHANICAL TREATMENT; THERMOSTATS; VISCOPLASTICITY;

EID: 3843144979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (17)
  • 2
    • 0003898494 scopus 로고
    • English transl. , Cambrigde University Press
    • English transl.: Mechanics of solid materials, Cambrigde University Press, 1990.
    • (1990) Mechanics of Solid Materials
  • 3
    • 0028753969 scopus 로고
    • Creep-fatigue interactions in eutectic tin-lead solder alloys
    • STP 1153, ASTM Publication Code Number (PCN) 04-011530-30, December
    • Kuo, Chih-Wei G., Sastry, Shankar M.L., and Jerina, Kenneth L. "Creep-Fatigue Interactions in Eutectic Tin-Lead Solder Alloys", Proceedings of the Symposium on Fatigue of Electronic Materials, STP 1153, ASTM Publication Code Number (PCN) 04-011530-30, December 1994, pp 22-41.
    • (1994) Proceedings of the Symposium on Fatigue of Electronic Materials
    • Kuo, C.-W.G.1    Sastry, S.M.L.2    Jerina, K.L.3
  • 5
  • 6
    • 0041858927 scopus 로고
    • Low-frequency, high-temperature low cycle fatigue of 60Sn-40Pb solder
    • ASTM Publication Code Number (PCN) 04-942000-30, October
    • Solomon, H.D., "Low-Frequency, High-Temperature Low Cycle Fatigue of 60Sn-40Pb Solder", Proceedings of the Symposium on Low Cycle Fatigue, ASTM Publication Code Number (PCN) 04-942000-30, October 1985, pp 342-370.
    • (1985) Proceedings of the Symposium on Low Cycle Fatigue , pp. 342-370
    • Solomon, H.D.1
  • 7
    • 0037593833 scopus 로고    scopus 로고
    • Characteristics of creep damage for 60Sn-40Pb solder material
    • September
    • Wei, Y., Chow, C.L., "Characteristics of Creep Damage for 60Sn-40Pb Solder Material", ASME Journal of Electronic Packaging, Vol. 123, September 2001, pp 278-283.
    • (2001) ASME Journal of Electronic Packaging , vol.123 , pp. 278-283
    • Wei, Y.1    Chow, C.L.2
  • 8
    • 0029696913 scopus 로고    scopus 로고
    • BGA and CGA solder attachments: Results of low-acceleration reliability test and analysis
    • Anaheim, CA, February
    • Engelmaier, Werner, "BGA and CGA Solder Attachments: Results of Low-Acceleration Reliability Test and Analysis", Proc. NEPCON West '96, Anaheim, CA, February 1996, pp 1020-1036.
    • (1996) Proc. NEPCON West '96 , pp. 1020-1036
    • Engelmaier, W.1
  • 10
    • 0040489198 scopus 로고    scopus 로고
    • CBGA solder joint reliability evaluation based on elastic-plastic-creep analysis
    • September
    • Pang, John H.L., Seetoh, C.W., Wang, Z.P., "CBGA Solder Joint Reliability Evaluation Based on Elastic-Plastic-Creep Analysis", ASME Journal of Electronic Packaging, Vol. 122, September 2000, pp 255-261.
    • (2000) ASME Journal of Electronic Packaging , vol.122 , pp. 255-261
    • Pang, J.H.L.1    Seetoh, C.W.2    Wang, Z.P.3
  • 12
    • 3843066861 scopus 로고    scopus 로고
    • Isothermal mechanical fatigue of Pb-free solders: Damage propagation rate & time to failure
    • Baltimore, MD, November 4-7
    • Zhang, Q., Haswell, P., Dasgupta, A. and Osterman, M., "Isothermal Mechanical Fatigue of Pb-free Solders: Damage Propagation Rate & Time to Failure", 34th International SAMPE Technical Conference, Baltimore, MD, November 4-7, 2002.
    • (2002) 34th International SAMPE Technical Conference
    • Zhang, Q.1    Haswell, P.2    Dasgupta, A.3    Osterman, M.4
  • 15
    • 0036212370 scopus 로고    scopus 로고
    • Implementation of a thermodynamic framework for damage mechanics of solder interconnects in microelectronics packaging
    • January
    • Basaran, Cernai and Tang, Hong, "Implementation of a Thermodynamic Framework for Damage Mechanics of Solder Interconnects in Microelectronics Packaging", International Journal of Damage Mechanics, Vol. 11, issue 01, January 2002, pp. 87-108.
    • (2002) International Journal of Damage Mechanics , vol.11 , Issue.1 , pp. 87-108
    • Basaran, C.1    Tang, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.