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Volumn 5377, Issue PART 1, 2004, Pages 415-427

Simulation of the coupled thermal/optical effects for liquid immersion micro/nanolithography

Author keywords

High NA; Liquid immersion; Optical lithography; Simulation

Indexed keywords

HIGH NUMERICAL APERTURE (NA); IMAGING SIMULATIONS; IMMERSION LITHOGRAPHY; LIQUID IMMERSION;

EID: 3843132841     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.537574     Document Type: Conference Paper
Times cited : (5)

References (12)
  • 1
    • 29044450067 scopus 로고    scopus 로고
    • Resolution enhancement of 157 nm lithography by liquid immersion
    • M. Switkes and M. Rothschild, "Resolution Enhancement of 157 nm Lithography by Liquid Immersion," J. Microlith., Microfab., Microsyst., Vol. 1, No. 3, pp. 225-228, 2002.
    • (2002) J. Microlith., Microfab., Microsyst. , vol.1 , Issue.3 , pp. 225-228
    • Switkes, M.1    Rothschild, M.2
  • 2
    • 0035519137 scopus 로고    scopus 로고
    • Immersion lithography at 157 nm
    • M. Switkes, M. Rothschild, "Immersion Lithography at 157 nm," J. Vac. Sci. Technol. B, Vol. 19, No. 6, pp. 2353-2356, 2001.
    • (2001) J. Vac. Sci. Technol. B , vol.19 , Issue.6 , pp. 2353-2356
    • Switkes, M.1    Rothschild, M.2
  • 3
    • 0023572806 scopus 로고
    • The future of subhalf-micrometer optical lithography
    • B. J. Lin, "The Future of Subhalf-Micrometer Optical Lithography," Microelectron. Eng., Vol. 6, pp. 31-51, 1987.
    • (1987) Microelectron. Eng. , vol.6 , pp. 31-51
    • Lin, B.J.1
  • 4
    • 84862398414 scopus 로고    scopus 로고
    • "Immersion Type Projection Exposure Apparatus," United States Patent 5610683
    • K. Takahashi, "Immersion Type Projection Exposure Apparatus," United States Patent 5610683, 1997.
    • (1997)
    • Takahashi, K.1
  • 5
    • 84862403586 scopus 로고
    • "Verfahren und Vorrichtung zum Kopieren eines Musters auf eine Halbleiterscheibe," European Patent EP23231
    • W. W. Tabarelli, "Verfahren und Vorrichtung zum Kopieren eines Musters auf eine Halbleiterscheibe," European Patent EP23231, 1981.
    • (1981)
    • Tabarelli, W.W.1
  • 7
    • 0036414999 scopus 로고    scopus 로고
    • Challenges in high NA, polarizations, and photoresists
    • B. W. Smith and J. Cashmore, "Challenges in High NA, Polarizations, and Photoresists," Proc. SPIE, Vol. 4691, pp. 11-24, 2002.
    • (2002) Proc. SPIE , vol.4691 , pp. 11-24
    • Smith, B.W.1    Cashmore, J.2
  • 9
    • 0942267546 scopus 로고    scopus 로고
    • Simulating fluid flow characteristics during the scanning process for immersion lithography
    • A. Wei, A. Abdo, G. Nellis, R. Engelstad, J. Chang, E. Lovell, and W. Beckman, "Simulating Fluid Flow Characteristics During the Scanning Process for Immersion Lithography," J. Vac. Sci. Technol. B, Vol. 21, No. 6, pp. 2788-2793, 2003.
    • (2003) J. Vac. Sci. Technol. B , vol.21 , Issue.6 , pp. 2788-2793
    • Wei, A.1    Abdo, A.2    Nellis, G.3    Engelstad, R.4    Chang, J.5    Lovell, E.6    Beckman, W.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.