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Volumn 88, Issue 23, 2006, Pages
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Mapping thermal conductivity using bimetallic atomic force microscopy probes
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON CANTILEVER;
TOPOGRAPHIC DISTORTION;
ATOMIC FORCE MICROSCOPY;
BIMETALS;
CANTILEVER BEAMS;
COATING TECHNIQUES;
FINITE ELEMENT METHOD;
LASER BEAMS;
MEASUREMENT THEORY;
SILICON;
SURFACE TOPOGRAPHY;
THIN FILM DEVICES;
THERMAL CONDUCTIVITY;
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EID: 33745021837
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2210973 Document Type: Article |
Times cited : (8)
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References (18)
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