Application of the X-ray tracing method to powder diffraction line profiles

Journal of Applied Crystallography

Volumn 41, Issue 1, 2008, Pages 153-160

  Lambert, Sébastien ^a   Guillet, François ^a  

^a CEA LE RIPAULT   (France)

Author keywords

Instrument function; Powder diffraction; Ray tracing

Indexed keywords

EID: 38349087185     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807055069     Document Type: Article

References (24)

1. Alianelli, L., Sanchez del Rio, M., Khan, M. & Cerrina, F. (2003). J. Synchrotron Rad. 10, 191-192.
2. Bergmann, J., Friedel, P. & Kleeberg, R. (1998). CPD Newsl. 20, 5-8.
3. Bragg, W. H. & Bragg, W. L. (1913a). Proc. R. Soc. London Ser. A, 88, 428-438.
4. Bragg, W. H. & Bragg, W. L. (1913b). Proc. R. Soc. London Ser. A, 89, 246-248.
5. Cheary, R. W., Coelho, A. A. & Cline, J. P. (2004). J. Res. NIST, 109, 1-24.
6. Deutsch, M., Hölzer, G., Härtwig, J., Wolf, J., Fristsch, M. & Förster, E. (1995). Phys. Rev. A, 51, 283-296.
7. Guinebretière, R. (2002). Diffraction des rayons X sur échantillons polycrystallins. Paris: Hermes Science Publications.
8. Hölzer, G., Fristsch, M., Deutsch, M., Härtwig, J. & Förster, E. (1997). Phys. Rev. A, 56, 4554-4568.
9. Honkimäki, V. (1996). J. Appl. Cryst. 29, 617-624.
10. Klug, H. P. & Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials. New York: John Wiley.
11. Lai, B. & Cerrina, F. (1986). Nucl. Instrum. Methods Phys. Res. A, 246, 337-341.
12. Lai, B., Chapman, K. & Cerrina, F. (1988). Nucl. Instrum. Methods Phys. Res. A, 266, 544-549.
13. Lancelle-Beltran, E., Prené, P., Boscher, C., Belleville, P., Buvat, P., Lambert, S., Guillet, F., Boissière, C., Grosso, D. & Sanchez, C. (2006). Chem. Mater. 18, 6152-6156.
14. Masson, O., Dooryhée, E. & Fitch, A. N. (2003). J. Appl. Cryst. 36, 286-294.
15. Masson, O., Guinebretiere, R. & Dauger, A. (2001). J. Appl. Cryst. 34, 436-441.
16. Sánchez-Bajo, F., Ortiz, A. L. & Cumbrera, F. L. (2006). J. Appl. Cryst. 39, 598-600.
17. Synder, R. L., Fiala, J. & Bunge, H. J. (1999). IUCr Monographs on Crystallography, No. 10. Oxford University Press.
18. Toraya, H. & Hibino, H. (2000). J. Appl. Cryst. 33, 1317-1323.
19. Vallé, K., Belleville, P., Pereira, F. & Sanchez, C. (2006). Nat. Mater. 5, 107-111.
20. Warren, B. E. (1969). X-ray Diffraction. New York: Addison-Wesley.
21. Welnak, C., Anderson, P., Khan, M., Singh, S. & Cerrina, F. (1992). Rev. Sci. Instrum. 63, 865-868.
22. Wilson, A. J. C. (1963). Mathematical Theory of X-ray Powder Diffractometry. London: Cleaver-Hume Press.
23. Yamada, T., Kawahara, N., Doi, M., Shoji, T., Tsuruoka, N. & Iwasaki, H. (2001). J. Synchrotron Rad. 8, 1047-1050.
24. Zuev, A. D. (2006). J. Appl. Cryst. 39, 304-314.