A new ray-tracing program RIGTRACE for X-ray optical systems

Journal of Synchrotron Radiation

Volumn 8, Issue 3, 2001, Pages 1047-1050

  Yamada, T ^a   Kawahara, N ^a   Doi, M ^a   Shoji, T ^a   Tsuruoka, N ^b   Iwasaki, H ^b  

^a RIGAKU CORPORATION   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

Beamlines; Ray tracing programs; X ray optics range

Indexed keywords

ARTICLE;

EID: 0035348378     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049501004289     Document Type: Article

References (8)

1. Handa, K., Sakai, I., Izuhara, O., Iwasaki, H., Yoshimura, Y., Masui, S. & Murata, T. (1999). Jpn. J. Appl. Phys. Suppl. 38(1), 654-657.
2. Iwasaki, H., Nakayama, Y., Ozutsumi, K., Yamamoto, Y., Tokunaga, Y., Saisho, H., Matsubara, T. & Ikeda, S. (1998). J. Synchrotron Rad. 5, 1162-1165.
3. James, R. W. (1958). The Optical Principles of the Diffraction of X-rays, p. 34. London: G. Bell and Sons.
4. Lai, B. & Cerrina, F. (1986). Nucl. Instrum. Methods, A246, 337-341.
5. Lai, B., Chapman, K. & Cerrina, F. (1988). Nucl. Instrum. Methods, A266, 544-549.
6. Saisho, H. (2000). Mem. SR Cent. Ritsumeikan Univ. 2, 141.
7. Underwood, J. H. & Barbee, T. W. Jr (1981). Low Energy X-ray Diagnostics-1981, p. 170. New York: American Institute of Physics.
8. Yamada, T., Nisawa, A., Shoji, T. & Utaka, T. (1999). J. Surf. Anal. 5, 124-127.