GISAXS study of the alignment of oriented carbon nanotubes grown on plain SiO 2/Si(100) substrates by a catalytically enhanced CVD process

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 12, 2007, Pages 4209-4229

  Mane Mane, J ^a   Cojocaru, C S ^a   Barbier, A ^b   Deville, J P ^a   Thiodjio Sendja, B ^a   Le Normand, F ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC LENGTHS; GRAZING INCIDENCE SMALL ANGLE X-RAY SCATTERING (GISAXS); PLASMA DIRECT CURRENT; X-RAY INCIDENCE ANGLES;

AMMONIA; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBES;

EID: 38049160904     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723201     Document Type: Article

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