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Journal of Physics Condensed Matter

Volumn 14, Issue 21, 2002, Pages 5303-5314

X-ray reflectivity of multilayers with non-continuous interfaces

(7) Rafaja, David a,d Fuess, Hartmut a Simek, Daniel b Kub, Jirí b Zweck, Josef c Vacínová, Jitka d Valvoda, Václav d

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

b INSTITUTE OF MATHEMATICS (Czech Republic)

c UNIVERSITY OF REGENSBURG (Germany)

d CHARLES UNIVERSITY (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CARRIER CONCENTRATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

X-RAY REFLECTIVITY;

MULTILAYERS;

EID: 0037013640 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/21/305 Document Type: Article

Times cited : (24)

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