Chalcogenide coatings of Ge15Sb20S65 and Te20As30Se50

Applied Optics

Volumn 47, Issue 13, 2008, Pages

  Nazabal, Virginie ^a   Cathelinaud, Michel ^b   Shen, Weidong ^b   Nemec, Petr ^c   Charpentier, Frédéric ^a   Lhermite, Hervée ^d   Anne, Marie Laure ^a   Capoulade, Jérémie ^b   Grasset, Fabien ^a   Moreac, Alain ^d   Inoue, Satoru ^e   Frumar, Miloslav ^c   Adam, Jean Luc ^a   Lequime, Michel ^b   Amra, Claude ^b  

^a INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

^d UNIVERSITÉ DE RENNES 1   (France)

^e NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDPASS FILTERS; CHALCOGENIDES; CHEMICAL ANALYSIS; COATINGS; DEPOSITION; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; GERMANIUM; GLASS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; TOPOGRAPHY;

CHALCOGENIDE GLASS; CHEMICAL COMPOSITIONS; ELECTRON BEAM DEPOSITIONS; HIGH-REFRACTIVE-INDEX MATERIALS; LOW-REFRACTIVE-INDEX MATERIALS; OPTICAL COMPONENTS; OPTOCHEMICAL SENSORS; PASS-BAND FILTERS;

REFRACTIVE INDEX;

EID: 38049099433     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00C114     Document Type: Article

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