Characteristics of the low electron density surface layer on BaTi O3 thin films

Applied Physics Letters

Volumn 92, Issue 1, 2008, Pages

  Li, X L ^a   Lu, H B ^a   Li, Ming ^a   Mai, Zhenhong ^a   Kim, Hyunjung ^b   Jia, Q J ^c  

^a INSTITUTE OF PHYSICS   (China)

^b Sogang University   (South Korea)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CARRIER CONCENTRATION; FILM THICKNESS; SUBSTRATES; SURFACE ANALYSIS; X RAY ANALYSIS;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; ELECTRON DENSITY SURFACE LAYER; SURFACE CORE-LEVEL SHIFT; X-RAY REFLECTIVITY;

EPITAXIAL FILMS;

EID: 38049063822     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828339     Document Type: Article

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