Surface relaxation in ferroelectric perovskites

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 17, 1999, Pages 11841-11845

  Ishikawa, Kenji ^a   Uemori, Takatoshi ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000645680     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.11841     Document Type: Article

References (15)

1. von C. Jaccard, W. Känzig, and M. Peter, Helv. Phys. Acta 26, 521 (1953).
2. W. Känzig and R. Sommerhalder, Helv. Phys. Acta 26, 603 (1953).
3. M. Anliker, R. Brugger, and R. Känzig, Helv. Phys. Acta 27, 99 (1954).
4. I. P. Batra, P. Wurfel, and D. Silverman, Phys. Rev. B 8, 3257 (1973).
5. K. Ishikawa, K. Yoshikawa, and N. Okada, Phys. Rev. B 37, 5852 (1988).
6. D. McCauley, R. E. Newnham, and C. A. Randall, J. Am. Ceram. Soc. 81, 979 (1998).
7. For example, a review article by D. R. Tilley, in Ferroelectric Thin Films, edited by C. P. Araujo, J. F. Scott, and G. W. Taylor (Gordon and Breach, Amsterdam, 1996), p. 11.
8. W. L. Zhong, Y. G. Wang, P. L. Zhang, and B. D. Qu, Phys. Rev. B 50, 698 (1994).
9. M. Tanaka and Y. Makino, Jpn. J. Appl. Phys., Suppl. 24-2, 984 (1985).
10. K. Ishikawa and K. Nagareda, in Proceedings of the 9th IMF [J. Korean Phys. Soc. 32, S56 (1998)].
11. K. Ishikawa, N. Okada, K. Takada, T. Nomura, M. Hagino, and K. Toyada, Jpn. J. Appl. Phys., Part 1 33, 5412 (1994).
12. B. Jian, J. Peng, and L. A. Bursill, Ferroelectrics 207, 445 (1998).
13. S. Dolfman, D. Fuks, and E. Kotomin, Thin Solid Films 318, 65 (1998).
14. E. Landree, L. D. Marks, P. Zschack, and C. J. Gilmore, Surf. Sci. 408, 300 (1998).
15. R. E. Cohen, Nature (London)358, 136 (1992).