Reflow dynamics of thin patterned viscous films

Applied Physics Letters

Volumn 92, Issue 1, 2008, Pages

  Leveder, T ^a   Landis, S ^a   Davoust, L ^b  

^a CEA LETI   (France)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FREE ENERGY; INTERFACIAL ENERGY; NANOMECHANICS; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; VISCOSITY;

REFLOW DYNAMICS; THIN PATTERNED VISCOUS FILMS; TIME SCALE ACCURACY METHOD; TRANSIENT SURFACE MOTION;

ULTRATHIN FILMS;

EID: 38049010866     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828986     Document Type: Article

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