메뉴 건너뛰기




Volumn 514-516, Issue PART 1, 2006, Pages 259-263

Study of the high frequency dielectric properties of SrBi 2Ta2O9 ferroelectric thin films

Author keywords

Dielectric loss; Ferroelectric; Microwave measurement; SrBi2Ta2O9 thin film

Indexed keywords

DIELECTRIC LOSSES; MICROWAVE CIRCUITS; MICROWAVE FREQUENCIES; MICROWAVE MEASUREMENT; RESONATORS; THIN FILMS;

EID: 37849043079     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.514-516.259     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 4
    • 2942679450 scopus 로고    scopus 로고
    • Time- domain Terahertz Spectroscopy of Strontium Bismuth Tantalate Thin Films
    • K. Kotani, M. Misra, I. Kawayama, M. Tonouchi, "Time- domain Terahertz Spectroscopy of Strontium Bismuth Tantalate Thin Films", Mat. Res. Soc. Symp. Proc., Vol. 784 (2004).
    • (2004) Mat. Res. Soc. Symp. Proc , vol.784
    • Kotani, K.1    Misra, M.2    Kawayama, I.3    Tonouchi, M.4
  • 5
    • 0032614826 scopus 로고    scopus 로고
    • The effect of bottom electrode on the performance of thin film based capacitors in the gigahertz region
    • D.C. Dube, J. Baborowski, P. Muralt, N. Setter, "The effect of bottom electrode on the performance of thin film based capacitors in the gigahertz region", Applied Physics Letters, Vol. 74, N. 23 (1999), pp. 3546-3548.
    • (1999) Applied Physics Letters , vol.74 , Issue.23 , pp. 3546-3548
    • Dube, D.C.1    Baborowski, J.2    Muralt, P.3    Setter, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.