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Journal of Physics D: Applied Physics

Volumn 32, Issue 12, 1999, Pages

Accurate assessment of the roughness exponent of a fracture surface via scanning tunnelling microscopy

(5) Deng, Jle a He, Y F b Ye, F a Long, Q Y a Lung, C W a

a INTERNATIONAL CENTRE FOR MATERIALS PHYSICS (China)

b INSTITUTE OF METAL RESEARCH (China)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; FRACTURE; IMAGE ANALYSIS; MEASUREMENT ERRORS; PROBABILITY; SCANNING TUNNELING MICROSCOPY; STATISTICAL METHODS;

ROUGHNESS EXPONENT;

SURFACE ROUGHNESS;

EID: 0032632935 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/32/12/101 Document Type: Article

Times cited : (5)

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