Package-induced catastrophic mirror damage of 980-nm GaAs high-power laser

Materials Chemistry and Physics

Volumn 88, Issue 2-3, 2004, Pages 410-416

  Park, Jongwoo ^a   Shin, D S ^b  

^a SAMSUNG Electronics   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

Accelerated aging test; Catastrophic mirror damage; Contact angle measurement; FTIR; Laser module; Oxygen plasma; Pump laser; RGA; SEM EDX; UV ozone; XPS

Indexed keywords

CONTACT ANGLE; ELECTROCHEMISTRY; ENERGY DISPERSIVE SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROCARBONS; LASER APPLICATIONS; PUMPING (LASER); SCANNING ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ACCELERATED AGING TEST; CATASTROPHIC MIRROR DAMAGE; CONTACT ANGLE MEASUREMENT; LASER MODULE; OXYGEN PLASMA; POWER LASERS; PUMP LASERS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 5444272376     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2004.08.012     Document Type: Article

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