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Volumn 3004, Issue , 1997, Pages 62-70
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Operational stability of 980-nm pump lasers at 200 mW and above
a
a
IBM
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
FAILURE ANALYSIS;
OPTICAL PUMPING;
PASSIVATION;
RANDOM PROCESSES;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING INDIUM COMPOUNDS;
SIMULATION;
STABILITY;
SUBMARINES;
TECHNOLOGY;
FACET PASSIVATION;
RANDOM-FAILURE ESTIMATION;
SEMICONDUCTOR LASERS;
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EID: 0031339382
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (11)
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References (12)
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