Corrigendum to "Morphology and microstructure of textured SnO2 thin films obtained by spray pyrolysis and their effect on electrical and optical properties" [Thin Solid Films 516 (2008) 1104-1111] (DOI:10.1016/j.tsf.2007.05.026);Morphology and microstructure of textured SnO2 thin films obtained by spray pyrolysis and their effect on electrical and optical properties

Thin Solid Films

Volumn 516, Issue 6, 2008, Pages 1104-1111

  Paraguay Delgado, F ^a   Miki Yoshida, M ^a   Antunez, W ^a   Gonzalez Hernandez J ^a   Vorobiev, Y V ^b   Prokhorov, E ^b  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

Atomic for microscopy; Electrical properties and measurements; Spray pyrolysis; Structural properties; Textured films; Tin dioxide; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; ELECTRIC PROPERTIES; MICROSTRUCTURE; OPTICAL PROPERTIES; PYROLYSIS; STRUCTURAL PROPERTIES; TIN DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC ORIENTATION; SPRAY PYROLYSIS; TEXTURED FILMS;

THIN FILMS;

EID: 37449013304     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.01.008     Document Type: Erratum

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