Analysis of nanocrystalline coatings of tin oxides on glass by atomic force microscopy

Sensors and Actuators, B: Chemical

Volumn 85, Issue 1-2, 2002, Pages 90-94

  Baranauskas, Vitor ^a   Santos, Thebano E A ^b   Schreiner, Marcos Antonio ^b   Jingguo, Zhao ^a   Mammana, Alaide Pellegrini ^b   Mammana, Carlos Ignacio Zamitti ^b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b CenPRA Centro de Pesquisas Renato Archer   (Brazil)

Author keywords

Atomic force microscopy; SnO2; Stannic oxide; Surface roughness; Tin oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; GLASS; GRAIN SIZE AND SHAPE; METHANOL; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SURFACE ROUGHNESS; TIN COMPOUNDS;

NANOCRYSTALLINE COATINGS;

COATINGS;

EID: 0037142233     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(02)00058-8     Document Type: Article

References (15)