Raman characterization of boron doped tetrahedral amorphous carbon films

Materials Research Bulletin

Volumn 43, Issue 2, 2008, Pages 453-462

  Tan, Manlin ^a   Zhu, Jiaqi ^a   Han, Jiecai ^a   Gao, Wei ^a   Liu, Aiping ^a   Han, Xiao ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

A. Amorphous materials; A. Thin films; B. Vapor deposition; C. Raman spectroscopy; D. Microstructure

Indexed keywords

AMORPHOUS CARBON; AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; GRAPHITE; MICROSTRUCTURE; RAMAN SPECTROSCOPY; SURFACE MORPHOLOGY; VAPOR DEPOSITION;

BORON CONTENT; BREIT-WIGNER-FANO LINE SHAPES; CATHODIC VACUUM ARC;

CARBON FILMS;

EID: 37349054723     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.02.037     Document Type: Article

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