Characterization of single layer PZT (53/47) films prepared from an air-stable sol-gel route

Journal of Materials Research

Volumn 10, Issue 12, 1995, Pages 3222-3231

  Tu, Y L ^a   Milne, S J ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARACTERIZATION; CRYSTALLIZATION; ELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PERMITTIVITY; POLARIZATION; SOL-GELS; TITANIUM; ZIRCONIUM;

DISSIPATION FACTOR; FIRING TEMPERATURES; HEATING RATES; INTERFACIAL REACTION; SOL-GEL ROUTE;

THIN FILMS;

EID: 0029536660     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1995.3222     Document Type: Article

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