Ultraviolet light emission from Si in a scanning tunneling microscope

Physical Review Letters

Volumn 99, Issue 24, 2007, Pages

  Schmidt, Patrick ^a   Berndt, Richard ^a   Vexler, Mikhail I ^b  

^a UNIVERSITY OF KIEL   (Germany)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; LIGHT EMISSION; OPTICAL TRANSITIONS; SCANNING TUNNELING MICROSCOPY; ULTRAVIOLET RADIATION;

AUGER PROCESSES; NEGATIVE BIAS; ZENER TUNNELING;

SILICON WAFERS;

EID: 37249068963     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.246103     Document Type: Article

References (29)

1. J.K. Gimzewski, B. Reihl, J.H. Coombs, and R.R. Schlittler, Z. Phys. B ZPCMDN 0722-3277 72, 497 (1988). 10.1007/BF01314531
2. Ph. Renaud and S.F. Alvarado, Phys. Rev. B PRBMDO 0163-1829 44, 6340 (1991). 10.1103/PhysRevB.44.6340
3. R. Berndt and J.K. Gimzewski, Phys. Rev. B PRBMDO 0163-1829 45, 14095 (1992). 10.1103/PhysRevB.45.14095
4. K. Ito, S. Ohyama, Y. Uehara, and S. Ushioda, Appl. Phys. Lett. 67, 2536 (1995). APPLAB 0003-6951 10.1063/1.114450
5. T. Murashita, J. Vac. Sci. Technol. B 15, 32 (1997). JVTBD9 0734-211X 10.1116/1.589250
6. T. Yokoyama and Y. Takiguchi, Surf. Sci. 482-485, 1163 (2001). SUSCAS 0039-6028 10.1016/S0039-6028(01)00871-8
7. M. Kemerink, K. Sauthoff, P.M. Koenraad, J.W. Gerritsen, H. van Kempen, and J.H. Wolter, Phys. Rev. Lett. 86, 2404 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.86.2404
8. I. Appelbaum, W. Yi, K.J. Russell, V. Narayanamurti, M.P. Hanson, and A.C. Gossard, Appl. Phys. Lett. 86, 063110 (2005). APPLAB 0003-6951 10.1063/1.1861961
9. R. Berndt, J.K. Gimzewski, and P. Johansson, Phys. Rev. Lett. 67, 3796 (1991). PRLTAO 0031-9007 10.1103/PhysRevLett.67.3796
10. C. Thirstrup, M. Sakurai, K. Stokbro, and M. Aono, Phys. Rev. Lett. 82, 1241 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.82.1241
11. M. Sakurai, C. Thirstrup, and M. Aono, Phys. Rev. Lett. 93, 046102 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.93.046102
12. A. Downes and M.E. Welland, Phys. Rev. Lett. 81, 1857 (1998). PRLTAO 0031-9007 10.1103/PhysRevLett.81.1857
13. J.R. Haynes and W.C. Westphal, Phys. Rev. 101, 1676 (1956). PHRVAO 0031-899X 10.1103/PhysRev.101.1676
14. W.P. Dumke, Phys. Rev. 105, 139 (1957). PHRVAO 0031-899X 10.1103/PhysRev.105.139
15. M.I. Vexler, A.F. Shulekin, D. Grgec, I.V. Grekhov, and B. Meinerzhagen, Microelectron. Eng. 72, 180 (2004). MIENEF 0167-9317 10.1016/j.mee.2003.12.033
16. J. Bude, N. Sano, and A. Yoshii, Phys. Rev. B PRBMDO 0163-1829 45, 5848 (1992). 10.1103/PhysRevB.45.5848
17. M. Pavesi, P.L. Rigolli, M. Manfredi, P. Palestri, and L. Selmi, Phys. Rev. B PRBMDO 0163-1829 65, 195209 (2002). 10.1103/PhysRevB.65.195209
18. S. Villa, A.L. Lacaita, and A. Pacelli, Phys. Rev. B PRBMDO 0163-1829 52, 10993 (1995). 10.1103/PhysRevB.52.10993
19. E. Cartier, J.C. Tsang, M.V. Fischetti, and D.A. Buchanan, Microelectron. Eng. 36, 103 (1997). MIENEF 0167-9317 10.1016/S0167-9317(97)00025-7
20. Th. Jürgens, Dissertation, Mathematisch-Naturwissenschaftliche Fakultät, Universität Kiel, Germany, 2003.
21. G. Hoffmann, J. Kröger, and R. Berndt, Rev. Sci. Instrum. 73, 305 (2002). RSINAK 0034-6748 10.1063/1.1433946
22. P.D. Yoder, M.I. Vexler, A.F. Shulekin, N. Asli, S.V. Gastev, I.V. Grekhov, P. Seegebrecht, S.E. Tyaginov, and H. Zimmermann, J. Appl. Phys. 98, 083511 (2005). JAPIAU 0021-8979 10.1063/1.2099507
23. D. Brust, M.L. Cohen, and J.C. Phillips, Phys. Rev. Lett. 9, 389 (1962). PRLTAO 0031-9007 10.1103/PhysRevLett.9.389
24. A. Daunois and D.E. Aspnes, Phys. Rev. B PRBMDO 0163-1829 18, 1824 (1978). 10.1103/PhysRevB.18.1824
25. R.R.L. Zucca and Y.R. Shen, Phys. Rev. B PLRBAQ 0556-2805 1, 2668 (1970). 10.1103/PhysRevB.1.2668
26. We use the notation from O. Madelung, Semiconductor-Basic Data (Springer, Berlin, 1996).
27. C. Chang, C. Hu, and R.W. Brodersen, J. Appl. Phys. 57, 302 (1985). JAPIAU 0021-8979 10.1063/1.334804
28. I.V. Grekhov, A.F. Shulekin, and M.I. Vexler, J. Phys. Condens. Matter 7, 7037 (1995). JCOMEL 0953-8984 10.1088/0953-8984/7/35/010
29. J. Bude, K. Hess, and G.J. Iafrate, Phys. Rev. B PRBMDO 0163-1829 45, 10958 (1992). 10.1103/PhysRevB.45.10958