Optical selection rules in light emission from the scanning tunneling microscope

Physical Review Letters

Volumn 93, Issue 4, 2004, Pages

  Sakurai, M ^a,b   Thirstrup, C ^c   Aono, M ^a,b,d  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Vir AS   (Denmark)

^d OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON TRANSITIONS; ELECTRON TUNNELING; ELECTRONIC STRUCTURE; LIGHT EMISSION; SEMICONDUCTOR MATERIALS; SILICON; TUNGSTEN; VOLTAGE CONTROL;

DIRECT TRANSITIONS; ELECTRON HOLES; FIBER BUNCHING; POLARIZATION ANGLE; VALENCE BONDS;

SCANNING TUNNELING MICROSCOPY;

EID: 4344565716     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.046102     Document Type: Article

References (22)

1. J. K. Gimzewski, B. Reil, J. H. Coombs, and R. R. Schlittier, Z. Phys. B 72, 497 (1988).
2. R. Berndt, J. K. Gimzewski, and P. Johansson, Phys. Rev. Lett. 67, 3796 (1991).
3. P. Johansson, R. Monreal, and P. Apell, Phys. Rev. B 42, 9210 (1990).
4. B. N. J. Persson and A. Baratoff, Phys. Rev. Lett. 68, 3224 (1992).
5. D. L. Abraham, A.Veider, Ch. Schönenberger, H. P. Meier, D. J. Arent, and S. F. Alvarado, Appl. Phys. Lett. 56, 1564 (1990).
6. L. Samuelson, J. Lindahl, L. Montelius, and M.-E. Pistol, Phys. Scr. T42, 149 (1992).
7. A. Downes and M. Welland, Phys. Rev. Lett. 81, 1857 (1998).
8. C. Thirstrup, M. Sakurai, K. Stokbro, and M. Aono, Phys. Rev. Lett. 82, 1241 (1999).
9. The transmission ratio of the two orthogonal polarization components through a Polarcor polarizer is 1:10000 in the range of 630-700 nm. An optical band-pass filter positioned in front of the detector was selected to allow light transmission with an energy of 1.91 ± 0.06 eV, which is within the wavelength range of the polarizer.
10. F. J. Himpsel, Adv. Phys. 32, 1 (1983).
11. P. Kruger, A. Mazur, J. Pollmann, and G. Wolfgarten, Phys. Rev. Lett. 57, 1468 (1986).
12. A. Ramstad, G. Brocks, and P. J. Kelley, Phys. Rev. B 51, 14504 (1995).
13. M. McEllistrem, G. Haase, D. Chen, and R. J. Hamers, Phys. Rev. Lett. 70, 2471 (1993).
14. J. J. Sakurai, Advanced Quantum Mechanics (Addison-Wesley, New York, 1967).
15. E. Anisimovas and P. Johansson, Phys. Rev. B 59, 5126 (1999).
16. A. Sommerfeld, Partial Differential Equations of Physics (Academic, New York, 1949).
17. An asymmetrical configuration of the tip-sample geometry induces the mixing of each polarized light Since the mixed light intensity depends weakly on energy of the light in the present system, the mixed component does not explain the energy dependent spectra The contribution can be neglected.
18. C. J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford University Press, Oxford, 1993).
19. S. Ohnishi and M. Tsukada, Solid State Commun. 71, 391 (1989).
20. In the case of metal sample surfaces, the difference becomes much larger. Then only p-polarized light is observed experimentally.
21. L. F. Mattheiss and D. R. Hamann, Phys. Rev. B 29, 5372 (1984).
22. I. R. Collins, A. D. Laine, and P.T. Andrews, J. Phys. Condens. Matter 4, 2891 (1992).