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Volumn 65, Issue 19, 2002, Pages 1952091-1952098

Spontaneous hot-carrier photon emission rates in silicon: Improved modeling and applications to metal oxide semiconductor devices

Author keywords

[No Author keywords available]

Indexed keywords

METAL OXIDE; SILICON;

EID: 0037092785     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.65.195209     Document Type: Article
Times cited : (15)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.