Response of a MEMS microshutter operating at 60 K to ionizing radiation

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2463-2467

  Buchner, S ^a,b   Rapchun, David A ^c   Moseley, Harvey ^d   Meyer, Stephen E ^d   Oldham, Tim ^d   Ray, Knute ^e   Tuttle, Jim ^d   Quinn, Ed ^f   Buchanan, Ernie ^g   Bloom, Dave ^d   Hait, Tom ^d   Pearce, Mike ^f   Beamer, A ^d  

^a IEEE   (United States)

^b Perot Systems   (United States)

^c Global Science and Technology Inc   (United States)

^d NASA HEADQUARTERS   (United States)

^e MEI   (United States)

^f NORTHROP GRUMMAN CORPORATION   (United States)

^g SCIENCE SYSTEMS AND APPLICATIONS INC   (United States)

Author keywords

Insulators; Low temperature; Micro electro mechanical system; Total ionizing dose

Indexed keywords

MICRO-ELECTRO-MECHANICAL SYSTEMS; TOTAL IONIZING DOSE;

IONIZING RADIATION; LOW TEMPERATURE EFFECTS; MICROARRAYS;

MEMS;

EID: 37249053351     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.910040     Document Type: Conference Paper

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