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Journal of Materials Science

Volumn 41, Issue 17, 2006, Pages 5619-5624

Correlation between optical, electrical and structural properties of vanadium dioxide thin films

(2) Mlyuka, N R a Kivaisi, R T a

a UNIVERSITY OF DAR ES SALAAM (Tanzania)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

GLASS SLIDES; REACTIVE RF MAGNETRON SPUTTERING; VANADIUM DIOXIDE THIN FILMS;

VANADIUM COMPOUNDS;

EID: 33748550376 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-006-0261-y Document Type: Article

Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.