Formation of Si nanocrystallites observed by in situ transmission electron microscopy and their effect on the enhancement of Er photoluminescence in Er-doped Si O2

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Fukata, N ^a,b,c   Morihiro, H ^b   Shirakawa, R ^b   Murakami, K ^b,c   Mitome, M ^a   Bando, Y ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERBIUM; PHOTOLUMINESCENCE; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON SPIN RESONANCE MEASUREMENTS; TRANSMISSION ELECTRON MICROSCOPY MEASUREMENTS;

NANOCRYSTALLITES;

EID: 37149003648     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817639     Document Type: Article

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