Optical excitation of Er ions with 1.5 μm luminescence via the luminescent state in Si nanocrystallites embedded in SiO2 matrices

Applied Physics Letters

Volumn 83, Issue 26, 2003, Pages 5422-5424

  Makimura, Tetsuya ^a   Kondo, Keiichi ^a   Uematsu, Hiroshi ^a   Li, Changqing ^a   Murakami, Kouichi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BAND STRUCTURE; BANDWIDTH; ENERGY GAP; ENERGY TRANSFER; ERBIUM COMPOUNDS; LASER ABLATION; LIGHT AMPLIFIERS; LUMINESCENCE; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; POROUS SILICON; SILICA; THERMAL EFFECTS;

CONDUCTION BANDS; EXCITATION ENERGY; QUANTUM CONFINEMENT EFFECTS;

NANOSTRUCTURED MATERIALS;

EID: 0942288653     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1636247     Document Type: Article

References (24)

1. S. Coffa, F. Priole, G. Franzò, V. Bellani, A. Carnera, and C. Spinella, Phys. Rev. B 48, 11782 (1993).
2. H. Przybylinska, W. Jantsch, Y. Suprun-Belevitch, M. Stepikhova, L. Palmetshofer, G. Hendorfer, A. Kozanecki, R. J. Wilson, and B. J. Sealy, Phys. Rev. B 54, 2532 (1996).
3. J. Stimmer, A. Reittinger, J. F. Nützel, G. Abstreiter, H. Holzbrecher, and C. Buchal, Appl. Phys. Lett. 68, 3290 (1996).
4. D. J. Eaglesham, J. Michel, E. A. Fitzgerald, D. C. Jacobson, J. M. Poate, J. L. Benton, A. Polman, Y.-H. Xie, and L. C. Kimerling, Appl. Phys. Lett. 58, 2797 (1991).
5. S. Coffa, G. Franzò, F. Priolo, A. Polman, and R. Serna, Phys. Rev. B 49, 16313 (1994).
6. J. H. Shin, G. N. van den Hoven, and A. Polman, Appl. Phys. Lett. 66, 2379 (1995).
7. A. Dorofeev, E. Bachilo, V. Bondarenko, N. Gaponenko, N. Kazuchits, A. Leshok, G. Troyanava, N. Vorozov, V. Borisenko, H. Gnaser, Thin Solid Films 276, 171 (1996).
8. U. Hömmerich, F. Namavar, A. Cremins, and K. L. Bray, Appl. Phys. Lett. 68, 1951 (1996).
9. X. Wu, U. Hömmerich, F. Namavar, and A. M. Cremins-Costa, Appl. Phys. Lett. 69, 1903 (1996).
10. M. Fujii, M. Yoshida, S. Hayashi, and K. Yamamoto, J. Appl. Phys. 84, 4525 (1998).
11. K. Watanabe, M. Fujii, and S. Hayashi, J. Appl. Phys. 90, 4761 (2001).
12. C. Li, K. Kondo, T. Makimura, and K. Murakami, Jpn. J. Appl. Phys. 42, 3424 (2003).
13. D. Kovalev, J. Dinner, H. Heckler, G. Polisski, N. Künzner, and F. Koch, Phys. Rev. B 61, 4485 (2000).
14. W. J. Miniscalco and R. S. Quimby, Opt. Lett. 16, 258 (1991).
15. M. Ben-Chorin, B. Averboukh, D. Kovalev, G. Polisski, and F. Koch, Phys. Rev. Lett. 77, 763 (1996).
16. F. Priolo, G. Franzò, D. Pacifici, V. Vinciguerra, F. Iacona, and A. Irrera, J. Appl. Phys. 89, 264 (2001).
17. D. Kovalev, H. Hechler, G. Polisski, and F. Koch, Phys. Status Solidi B 215, 871 (1999).
18. S. Takeoka, M. Fujii, and S. Hayashi, Phys. Rev. B 62, 16820 (2000).
19. G. Franzò, D. Pacifici, V. Vinciguerra, F. Priolo, and F. Iacona, Appl. Phys. Lett. 76, 2167 (2000).
20. A. J. Kenyon, P. F. Trwoga, M. Federighi, and C. W. Pitt, J. Phys.: Condens. Matter 6, L319 (1994).
21. X. Zhao, H. Isshiki, Y. Aoyagi, T. Sugano, and S. Komuro, Mater. Sci. Eng., B 74, 197 (2000).
22. M. L. Brongersma, P. G. Kik, A. Polman, K. S. Min, and H. A. Atwater, Appl. Phys. Lett. 76, 351 (2000).
23. X. L. Wu, Y. F. Mei, G. G. Siu, K. L. Wong, K. Moulding, M. J. Stokes, C. L. Fu, and X. M. Bao, Phys. Rev. Lett. 86, 3000 (2001).
24. P. G. Kik, M. L. Brongersma, and A. Polman, Appl. Phys. Lett. 76, 2325 (2000).