Quantitative structural analysis of individual nanotubes by electron diffraction

Zeitschrift fur Kristallographie

Volumn 222, Issue 11, 2007, Pages 625-633

  Zuo, Jian Min ^a   Kim, Taekyung ^a   Celik Aktas, Ayten ^a,c   Tao, Jing ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

Chiral vector determination; Electron diffraction; Multiwall carbon nanotube; Nanotube structure analysis; Single wall carbon nanotube

Indexed keywords

EID: 36949022939     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2007.222.11.625     Document Type: Article

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