The visual vulnerability spectrum: Characterizing architectural vulnerability for graphics hardware

Proceedings of the SIGGRAPH/Eurographics Workshop on Graphics Hardware

Volumn , Issue , 2006, Pages 9-16

  Sheaffer, Jeremy W ^a   Luebke, David P ^b   Skadron, Kevin ^a  

^a University of Virginia   (United States)

^b NVIDIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; GRAPHIC METHODS; MICROPROCESSOR CHIPS; SEMICONDUCTOR MATERIALS; TRANSIENT ANALYSIS;

ARCHITECTURAL VULNERABILITY FACTOR (AVF); VISUAL VULNERABILITY SPECTRUM (VVS);

HARDWARE;

EID: 36949014712     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1283900.1283902     Document Type: Conference Paper

References (12)

1. BORRAR S.: Designing reliable systems from unreliable components: The challenges of transistor variability and degradation. IEEE Micro 25, 6 (Nov./Dec. 2005), 10-16.
2. HUMPHREYS G., HOUSTON M., NG R., AHERN S., FRANK R., KIRCHNER P., KLOSOWSKI J. T.: Chromium.: A stream processing framework, for interactive graphics on clusters of workstations. ACM Transactions on Graphics 21, 3 (July 2002), 693-702.
3. HAZUCHA P., KARNIK T., MAIZ J., WALSTRA S., BLOECHEL B., TSCHANZ J., DERM'ER G., HARELAND S., ARMSTRONG P., BORKAR S.: Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM: from 0.25-μm to 90-nm generation. In IEEE International Electron Devices Meeting 2003 Technical Digest (Dec. 2003), IEEE, pp. 523-526.
4. MUKHERJEE S. S., EMER J. S., REINHARDT S. K.: The soft error problem.: An architectural perspective. In HPCA (2005), IEEE, IEEE Computer Society, pp. 243-247.
5. MUKHERJEE S. S., KONTZ M., REINHARDT S. K.: Detailed design and evaluation of redundant multithreading alternatives. In ISCA (2002), IEEE, IEEE Computer Society, pp. 99-110.
6. NORMAND E.: Single event upsets at ground level. IEEE Transactions on Nuclear Science 43, 6 (Dec. 1996).
7. PAUL B., ET AL.: The Mesa 3-D graphics library, 1993-2006. http://www.mesa3d.org/.
8. SEGAL M., AKELEY K. (Eds.): The OpenGL Graphics System A. Specification (Version 2.0 - October 22, 2004). Silicon Graphics Inc., Oct. 2004.
9. SRINIVASAN J., ADVE S. V., BOSE P., RIVERS J. A.: The impact of technology scaling on lifetime reliability. In DSN (2004), IEEET IEEE Computer Society, pp. 177-.
10. SAMSUNG ELECTRONICS: 256Mbit GDDR3 SDRAM: Revision 1.8, April 2005.
11. ZIEGLER J. F., CURTIS H. W., MUHLFELD H. P., MONTROSE C. J., CHIN B.: IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40, 1(1996), 3-18.
12. ZIEGLER J. F.: Terrestrial cosmic rays. IBM J. Res. Dev. 40, 1 (1996), 19-39.