Microstructure and field emission properties of the Si-TaSi2 eutectic in situ composites by electron beam floating zone melting technique

Journal of Crystal Growth

Volumn 310, Issue 1, 2008, Pages 71-77

  Cui, Chunjuan ^a   Zhang, Jun ^a   Jia, Zhiwei ^a   Su, Haijun ^a   Liu, Lin ^a   Fu, Hengzhi ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

A1. Directional solidification; A1. Eutectic in situ composite; A1. Transmission electron microscopy; A2. Electron beam floating zone melting; B2. Si TaSi2; B3. Field emission

Indexed keywords

ELECTRON BEAMS; FIELD EMISSION; MELTING; MICROSTRUCTURE; SILICON; SOLIDIFICATION; TANTALUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BEAM FLOATING ZONE MELTING; FIELD EMISSION PROPERTIES;

EUTECTICS;

EID: 36549004002     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.10.023     Document Type: Article

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