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Volumn 515, Issue 2-3, 2002, Pages 369-376
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Field emission current from Si tip: Ultra-fast time resolved measurements
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Author keywords
Field emission; Field emission microscopy; Phonons; Silicon; Surface diffusion; Surface waves; Tunneling
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Indexed keywords
CURRENT DENSITY;
ELECTRIC CURRENTS;
ELECTRON TUNNELING;
FIELD EMISSION MICROSCOPES;
PHONONS;
SEMICONDUCTING SILICON;
SPECTROSCOPIC ANALYSIS;
SURFACE WAVES;
ULTRAFAST PHENOMENA;
FIELD EMISSION CURRENTS;
SURFACE DIFFUSION;
SURFACE STRUCTURE;
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EID: 0036719956
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)01922-2 Document Type: Article |
Times cited : (3)
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References (42)
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