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Volumn 515, Issue 2-3, 2002, Pages 369-376

Field emission current from Si tip: Ultra-fast time resolved measurements

Author keywords

Field emission; Field emission microscopy; Phonons; Silicon; Surface diffusion; Surface waves; Tunneling

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRON TUNNELING; FIELD EMISSION MICROSCOPES; PHONONS; SEMICONDUCTING SILICON; SPECTROSCOPIC ANALYSIS; SURFACE WAVES; ULTRAFAST PHENOMENA;

EID: 0036719956     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01922-2     Document Type: Article
Times cited : (3)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.