Microstructure and property of Czochralski-grown Si-TaSi2 eutectic in situ composite for field emission

Journal of Crystal Growth

Volumn 276, Issue 1-2, 2005, Pages 92-96

  Zhang, Jun ^a   Cui, Chunjuan ^a   Han, Min ^a   Chen, Jun ^b   Xu, Ningsheng ^b   Liu, Lin ^a   Fu, Hengzhi ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

^b SUN YAT SEN UNIVERSITY   (China)

Author keywords

A1. Eutectic in situ composite; A2. Czochralski method; B2. Si TaSi 2; B3. Field emission

Indexed keywords

EUTECTICS; FIELD EMISSION MICROSCOPES; MICROSTRUCTURE; OPTICAL FIBERS; SCHOTTKY BARRIER DIODES; SOLIDIFICATION;

CZOCHRALSKI METHOD; EUTECTIC IN SITU COMPOSITE; FIELD EMISSION METHOD; SI-TASI2;

CRYSTAL GROWTH FROM MELT;

EID: 20344377978     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.10.060     Document Type: Article

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