Surface charge on ferroelectric thin film by high electric field induced at scanning probe microscope tip

Journal of the Korean Physical Society

Volumn 51, Issue SUPPL. 2, 2007, Pages

  Son, J Y ^a   Shin, Young Han ^a   Lee, Han Bo Ram ^a   Kim, H ^a   Cho, J H ^b   Ali, A I ^c  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Pusan National University   (South Korea)

^c HELWAN UNIVERSITY   (Egypt)

Author keywords

AFM tip; Electric field; Ferroelectric domain; Leakage current

Indexed keywords

EID: 36349000671     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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