Bulk silicon is susceptible to fatigue

Applied Physics Letters

Volumn 91, Issue 20, 2007, Pages

  Bhowmick, Sanjit ^a   Meĺndez Martínez, Juan Joś ^b   Lawn, Brian R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; CYCLIC LOADS; DEGRADATION; FATIGUE OF MATERIALS; SHEAR STRESS; SINGLE CRYSTALS;

BULK SILICON; MACROSCALE CRACKS; PROGRESSIVE DEGRADATION; SILICON SURFACE;

SILICON;

EID: 36249030971     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2801390     Document Type: Article

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