Nanosecond-range measurements of imprint effect for Pt/IrO 2/Pb(Zr0.4Ti0.6)O3/IrO 2/Pt thin-film capacitors

Applied Physics Letters

Volumn 91, Issue 20, 2007, Pages

  Jiang, A Q ^a   Lin, Y Y ^a   Tang, T A ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; FERROELECTRICITY; PLATINUM COMPOUNDS; POLARIZATION; THIN FILMS;

CURRENT PLATEAU; IMPRINT EFFECT; LOGARITHMIC SCALE; NANOSECOND RANGE MEASUREMENTS;

CAPACITORS;

EID: 36249019717     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2815643     Document Type: Article

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