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Volumn , Issue , 2007, Pages 5-8

Investigations on 6.5kV trench IGBT and adapted EmCon diode

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC LOSSES; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); SWITCHING; TECHNOLOGY TRANSFER;

EID: 36248931923     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2007.4294918     Document Type: Conference Paper
Times cited : (14)

References (9)
  • 1
    • 0036053240 scopus 로고    scopus 로고
    • M. Pfaffenlehner, T. Laska, R. Mallwitz, A.Mauder, F. Pfirsch, C. Schaeffer, 1700V-IGBT3: Field Stop Technology with Optimized Trench Structure - Trend setting for The High Power Applications in Industry and Traction, Proc. ISPSD, 2002, pp. 105-109.
    • M. Pfaffenlehner, T. Laska, R. Mallwitz, A.Mauder, F. Pfirsch, C. Schaeffer, "1700V-IGBT3: Field Stop Technology with Optimized Trench Structure - Trend setting for The High Power Applications in Industry and Traction," Proc. ISPSD, 2002, pp. 105-109.
  • 2
    • 4944245538 scopus 로고    scopus 로고
    • New 3000Vchip Generation with a Trench IGBT and an Optimized Field Stop Concept with a Smoot Switching Behavior
    • M. Pfaffenlehner, J. Biermann, C. Schaeffer, H. Schulze, "New 3000Vchip Generation with a Trench IGBT and an Optimized Field Stop Concept with a Smoot Switching Behavior," Proc. ISPSD, 2004, pp.107-110.
    • (2004) Proc. ISPSD , pp. 107-110
    • Pfaffenlehner, M.1    Biermann, J.2    Schaeffer, C.3    Schulze, H.4
  • 3
    • 0036053273 scopus 로고    scopus 로고
    • Conductivity Modulation Improvement in 6.5kV Trench UMOS Insulated Gate Bipolar Transistors
    • R. Natarajan and T.P. Chow, "Conductivity Modulation Improvement in 6.5kV Trench UMOS Insulated Gate Bipolar Transistors," Proc. ISPSD, 2002, pp.121-124.
    • (2002) Proc. ISPSD , pp. 121-124
    • Natarajan, R.1    Chow, T.P.2
  • 5
    • 27744488548 scopus 로고    scopus 로고
    • Investigations on the Ruggedness Limit of 6.5 kV IGBT, Proc
    • J.G. Bauer, O. Schilling, C.Schaeffer, F.Hille, "Investigations on the Ruggedness Limit of 6.5 kV IGBT, "Proc. ISPSD, 2005, pp. 71-74.
    • (2005) ISPSD , pp. 71-74
    • Bauer, J.G.1    Schilling, O.2    Schaeffer, C.3    Hille, F.4
  • 6
    • 34247544446 scopus 로고    scopus 로고
    • Novel Enhanced-Planar IGBT Technology Rated up to 6.5KV for Lower Losses and Higher SOA Capability
    • M. Rahimo, A. Kopta, S. Linder, "Novel Enhanced-Planar IGBT Technology Rated up to 6.5KV for Lower Losses and Higher SOA Capability," Proc. ISPSD, 2006, pp. 69-72.
    • (2006) Proc. ISPSD , pp. 69-72
    • Rahimo, M.1    Kopta, A.2    Linder, S.3
  • 7
    • 34247476289 scopus 로고    scopus 로고
    • Source Side Thermal Runaway of Trench IGBTs, Dependence on Design Aspects
    • A.Müller-Dauch, F.Pfirsch, M.Pfaffenlehner, D. Silber, "Source Side Thermal Runaway of Trench IGBTs, Dependence on Design Aspects," Proc. ISPSD, 2006, pp 21-24.
    • (2006) Proc. ISPSD , pp. 21-24
    • Müller-Dauch, A.1    Pfirsch, F.2    Pfaffenlehner, M.3    Silber, D.4
  • 8
    • 4944227122 scopus 로고    scopus 로고
    • Switching-Self-Clamping-Mode "SSCM", a breakthrough in SOA performance for high voltage IGBTs and Diodes
    • M. Rahimo, A. Kopta, S. Eicher, U. Schlapbach and S. Linder, "Switching-Self-Clamping-Mode "SSCM", a breakthrough in SOA performance for high voltage IGBTs and Diodes," Proc. ISPSD, 2004, pp.437-440
    • (2004) Proc. ISPSD , pp. 437-440
    • Rahimo, M.1    Kopta, A.2    Eicher, S.3    Schlapbach, U.4    Linder, S.5
  • 9
    • 4944243916 scopus 로고    scopus 로고
    • 1200V FS-IGBT module with enhanced dynamic clamping capability
    • M. Otsuki, Y. Onozawa, S.Yoshiwatari, and Y. Seki, "1200V FS-IGBT module with enhanced dynamic clamping capability," Proc. ISPSD, 2004, pp. 339-342.
    • (2004) Proc. ISPSD , pp. 339-342
    • Otsuki, M.1    Onozawa, Y.2    Yoshiwatari, S.3    Seki, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.