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Volumn 84, Issue 12, 2007, Pages 2817-2831

Chemical mechanical planarization operation via dynamic programming

Author keywords

Chemical mechanical planarization; Copper dishing; Dynamic programming; Non planarization index; Oxide erosion

Indexed keywords

DYNAMIC PROGRAMMING; EROSION; FORCE CONTROL; OPTIMIZATION; PARAMETER ESTIMATION; SILICA; THICKNESS MEASUREMENT;

EID: 36148983047     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.02.003     Document Type: Article
Times cited : (3)

References (18)
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    • 36148977788 scopus 로고    scopus 로고
    • Texas Engineering Extension Service, CMP, TEEX, 2001.
  • 5
    • 36148983243 scopus 로고    scopus 로고
    • F. Zhang, A. Busnaina, J. Feng, M.A. Fury, in: Proceedings of the Fourth International Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference, 1999 pp. 61-64.
  • 7
    • 36148957342 scopus 로고    scopus 로고
    • B. Zhao, F.G. Shi, in: Proceedings of the Fourth International Chemical- Mechanical Planarization for ULSI Multilevel Interconnection Conference, 1999 pp. 13-22.
  • 12
    • 85012688561 scopus 로고
    • Princeton University Press, Princeton, NJ
    • Bellman R. Dynamic Programming (1957), Princeton University Press, Princeton, NJ
    • (1957) Dynamic Programming
    • Bellman, R.1
  • 13
    • 36148953740 scopus 로고    scopus 로고
    • Hung-Yin Tsai, "Analysis of Non-uniformity Based on Material Removal and Kinematics in Chemical Mechanical Planarization," M.S. thesis, Department of Power Mechanical Engineering, National Tsing Hua University, 1999.
  • 14
    • 36148950346 scopus 로고    scopus 로고
    • Keng-Ming Liu, "Study on the Chemical Mechanical Polishing of Copper Thin Films," M.S. thesis, Department of Electronic Engineering, National Chiao Tung University, 2000.
  • 16
    • 36148985537 scopus 로고    scopus 로고
    • Junne-Dar Chan, "Tribochemical Reactions on Cu-film Influenced by Mechanical Stresses in Chemical Mechanical Polishing," M.S. thesis, Department of Mechanical Engineering, National Cheng Kung University; 2000.
  • 17
    • 36148949563 scopus 로고    scopus 로고
    • K. Wijekoon, S. Tsai, M. Chandrachood, B. Brown, F. Redeker, S. Nanjangud, G. Amico, in: SEMI/Japan Technical Symposium, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.