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Volumn 84, Issue 12, 2007, Pages 2817-2831
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Chemical mechanical planarization operation via dynamic programming
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Author keywords
Chemical mechanical planarization; Copper dishing; Dynamic programming; Non planarization index; Oxide erosion
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Indexed keywords
DYNAMIC PROGRAMMING;
EROSION;
FORCE CONTROL;
OPTIMIZATION;
PARAMETER ESTIMATION;
SILICA;
THICKNESS MEASUREMENT;
COPPER DISHING;
NON-PLANARIZATION INDEX;
OXIDE EROSION;
CHEMICAL MECHANICAL POLISHING;
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EID: 36148983047
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2007.02.003 Document Type: Article |
Times cited : (3)
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References (18)
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