Scanning gate microscopy of copper phthalocyanine field effect transistors

Applied Physics Letters

Volumn 91, Issue 19, 2007, Pages

  Aoki, Nobuyuki ^a   Sudou, Kouhei ^a   Okamoto, Kazuya ^a   Bird, Jonathan P ^b   Ochiai, Yuichi ^a  

^a CHIBA UNIVERSITY   (Japan)

^b UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; GATE DIELECTRICS; MICROSCOPIC EXAMINATION; SCHOTTKY BARRIER DIODES; THIN FILMS;

COPPER PHTHALOCYANINE; METAL ELECTRODES; ORGANIC CHANNELS; ORGANIC THIN FILM FIELD EFFECT TRANSISTORS (OFETS);

FIELD EFFECT TRANSISTORS;

EID: 36048954443     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2812575     Document Type: Article

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