Atomic force microscopy investigations of gadolinia doped ceria thin films prepared by pulsed laser deposition technique

Materials Science- Poland

Volumn 25, Issue 3, 2007, Pages 671-678

  Muthukkumaran, K ^a   Kuppusami, P ^b   Mathews, T ^b   Mohandas, E ^b   Selladurai, S ^a  

^a ANNA UNIVERSITY   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Atomic force microscopy; Gadolinia doped ceria; Pulsed laser deposition

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; DOPING (ADDITIVES); GADOLINIUM COMPOUNDS; PULSED LASER DEPOSITION; SURFACE STRUCTURE;

GADOLINIUM DOPED CERIA; PARTICLE DISTRIBUTION; SURFACE STRUCTURE EVOLUTION;

THIN FILMS;

EID: 36048931062     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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