Atomic force microscopy and photoemission electron microscopy study of the low-pressure oxidation of transition metal nitrides

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Fleming, A J ^a   Surnev, S ^a   Netzer, F P ^a  

^a UNIVERSITY OF GRAZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; NITRIDES; OXIDATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; THERMAL EFFECTS; THIN FILMS; WORK FUNCTION;

LOW-PRESSURE OXIDATION; SURFACE PRECIPITATES; TRANSITION METAL NITRIDES;

TRANSITION METAL COMPOUNDS;

EID: 35648946313     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794474     Document Type: Article

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