Microstructural characterization of the oxide scale on nitride bonded SiC-ceramics

Ceramics International

Volumn 34, Issue 1, 2008, Pages 151-155

  Horvath E ^a   Zsiros Gy ^b   Toth A L ^a   Sajo I ^c   Arato P ^a   Pfeifer, J ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b R and D Department Imerys Kiln Furniture Hungary Ltd   (Hungary)

^c CHEMICAL RESEARCH CENTER   (Hungary)

Author keywords

A. Firing; B. Microstructure final; D. SiC; Oxide scale

Indexed keywords

CERAMIC MATERIALS; CRYSTALLITES; ETCHING; HIGH TEMPERATURE EFFECTS; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SILICON NITRIDE;

MICROSTRUCTURAL CHARACTERIZATION; OXIDE SCALES;

MICROSTRUCTURE;

EID: 35548960485     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2006.09.003     Document Type: Article

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