Characterization of Si 3N 4/SiO 2 planar lightwave circuits and ring resonators

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5350, Issue , 2004, Pages 13-22

  Guo, Junpeng ^a   Vawter, G Allen ^a   Shaw, Michael J ^a   Hadley, G Ronald ^a   Esherick, Peter ^a   Jain, Anisha ^a   Alford, Charles R ^b   Sullivan, Charles T ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b L and M Technologies Inc   (United States)

Author keywords

Lateral mode interferometer (LMI); Ring resonator; Waveguide loss; Waveguide polarizer

Indexed keywords

LATERAL MODE INTERFEROMETRY; RING RESONATORS; WAVEGUIDE LOSSES; WAVEGUIDE POLARIZER;

INTERFEROMETRY; NETWORKS (CIRCUITS); PHOTODETECTORS; REFRACTIVE INDEX; RESONATORS; SEMICONDUCTOR DOPING; SILICA; SILICON WAFERS; SUBSTRATES; WAVEGUIDES;

SILICON NITRIDE;

EID: 3543052866     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.529641     Document Type: Conference Paper

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