In situ Raman spectroscopy and spectroscopic ellipsometry analysis of the iron/polypyrrole interface

Journal of Physical Chemistry C

Volumn 111, Issue 39, 2007, Pages 14400-14409

  Van Schaftinghen, Thomas ^a   Joiret, Suzanne ^b   Deslouis, Claude ^b   Terryn, Herman ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^b Université Pierre et Marie Curie   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; POLYPYRROLES; RAMAN SPECTROSCOPY; SUBSTRATES; THICKNESS MEASUREMENT;

INTRINSICALLY CONDUCTING POLYMER (ICP); IRON OXALATE; POLYPYRROLE INTERFACE;

ELECTROCHEMICAL CORROSION;

EID: 35348983488     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0734878     Document Type: Article

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