Stress relaxation effects in ferroelectric thin films and superlattices

Ferroelectrics

Volumn 334, Issue 1 PART 2, 2006, Pages 211-222

  Katiyar, R S ^a   Yuzyuk, Yu I ^b  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

Raman scattering; superlattice; ultrathin films

Indexed keywords

BACKSCATTERING GEOMETRY; DOMAIN STRUCTURE; ENHANCED TETRAGONALITY; HETEROEPITAXIAL; LOCAL STRESS; MGO SUBSTRATE; MGO THIN FILMS; MICRO-RAMAN SCATTERING; PRIMARY EFFECTS; RELAXATION EFFECT; SOFT MODES; SRTIO; STACKING PERIODICITY; STRESS EFFECTS; TETRAGONAL DISTORTION; THERMAL EXPANSION COEFFICIENTS; THERMOELASTICS; TIO; TWO-DIMENSIONAL STRESS; ULTRA-THIN;

BARIUM; BARIUM COMPOUNDS; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; LATTICE MISMATCH; RAMAN SCATTERING; RESIDUAL STRESSES; SCATTERING; STRESS RELAXATION; STRONTIUM ALLOYS; SUBSTRATES; SUPERLATTICES; THERMAL EXPANSION; TWO DIMENSIONAL; VAPOR DEPOSITION;

ULTRATHIN FILMS;

EID: 35348966291     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190600695842     Document Type: Conference Paper

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