Scanning kelvin force microscopy for characterizing nanostructures in atmosphere

AIP Conference Proceedings

Volumn 931, Issue , 2007, Pages 530-534

  Kopanski, J J ^a   Afridi, M Y ^a   Jeliazkov, S ^a   Jiang, W ^a   Walker, T R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Contact potential difference; EFM; Electrostatic force microscope; Scanning Kelvin force microscope; SKFM; Work function

Indexed keywords

EID: 35348915950     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2799430     Document Type: Conference Paper

References (11)

1. M. Nonenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921-2923 (1991).
2. M. Saint Jean, S. Hudlet, C. Guthmann, and J. Berger, J. Appl. Phys. 86, 5245-5248 (1999).
3. J. Colchero, A. Gil, and A. M. Baró, Phys. Rev. B 64, 245403 (2001).
4. H. Sugimura, Y. Ishida, K. Hayashi, O. Takai, and N. Nakagiri, Appl. Phys. Lett. 80, 1459-1461 (2002).
5. H. B. Michaelson, J. Appl. Phys. 48, 4729-4733 (1977).
6. H. O. Jacobs, P. Leuchtmann, O. J. Homan, and A. Stemmer, J. Appl. Phys. 84, 1168-1173 (1998).
7. G. Koley, M. G. Spencer, and H. R. Bhangale, Appl. Phys. Lett. 79, 545-547 (2001).
8. A. Gil, J. Colchero, J. Gómez-Herrero, and A. M. Baró, Nanotechnology 14, 332-340 (2003).
9. C. H. Lei, A. Das, M. Elliott, and J. E. Macdonald, Nanotechnology 15, 627-634 (2004).
10. U. Zerweck, C. Loppacher, T. Otto, S. Grafström, and L. M. Eng, Phys. Rev. B 71, 125424 (2005).
11. C. Loppacher, U. Zerweck, S. Teich, E. Beyreuther, T. Otto, S. Grafström, and L. M. Eng, Nanotechnology 16, S1-S6 (2005).