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Volumn 4, Issue 9, 2007, Pages 3183-3190

Surface reconstructions of II-VI compound semiconductor surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DISPLACEMENTS; ATOMIC GEOMETRY; SPOT-PROFILE ANALYSIS; SURFACE STRAIN;

EID: 35148901663     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200775425     Document Type: Article
Times cited : (2)

References (20)
  • 17
    • 35248895458 scopus 로고    scopus 로고
    • unpublished
    • O. Bunk, unpublished.
    • Bunk, O.1
  • 20
    • 0344739783 scopus 로고    scopus 로고
    • C. Kumpf, A. Müller, W. Weigand, E. Umbach, J. Wagner, V. Wagner, S. Gundel, L. Hansen, J. Geurts, O. Bunk, J. H. Zeysing, F. Wu, and R. L. Johnson, Phys. Rev. B 68, 035339 (2003).
    • C. Kumpf, A. Müller, W. Weigand, E. Umbach, J. Wagner, V. Wagner, S. Gundel, L. Hansen, J. Geurts, O. Bunk, J. H. Zeysing, F. Wu, and R. L. Johnson, Phys. Rev. B 68, 035339 (2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.