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Volumn 15, Issue 20, 2007, Pages 13227-13235

Near-field imaging of quantum cascade laser transverse modes

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; OPTICAL MICROSCOPY; SOLID STATE LASERS; WAVELENGTH;

EID: 35148894958     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.013227     Document Type: Article
Times cited : (44)

References (18)
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    • A. E. Siegman, "Defining, measuring, and optimizing laser beam quality," in Proceedings of SPIE. Vol. 1868: Laser Resonators and Coherent Optics: Modeling, Technology, and Applications, A. Bhowmik, ed. (the International Society for Optical Engineering, 1993), pp. 2-12.
  • 2
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    • A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boceara, "Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600," Opt. Lett. 21, 1315-1317 (1996).
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    • Lahrech, A.1    Bachelot, R.2    Gleyzes, P.3    Boceara, A.C.4
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    • Imaging a GaAlAs laser diode in operation using apertureless scanning near-field optical microscopy
    • G. Wurtz, R. Bachelot, and P. Royer, "Imaging a GaAlAs laser diode in operation using apertureless scanning near-field optical microscopy," Eur. Phys. J. AP. 5, 269-275 (1999).
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  • 9
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    • Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
    • B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000).
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    • Knoll, B.1    Keilmann, F.2
  • 10
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    • Nanoscale polymer recognition, by spectral signature in scattering infrared near-field microscopy
    • T. Taubner, R. Hillenbrand, and F. Keilmann, "Nanoscale polymer recognition, by spectral signature in scattering infrared near-field microscopy," Appl. Phys. Lett. 85, 5064-5066 (2004).
    • (2004) Appl. Phys. Lett , vol.85 , pp. 5064-5066
    • Taubner, T.1    Hillenbrand, R.2    Keilmann, F.3
  • 11
    • 33746884272 scopus 로고    scopus 로고
    • Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution
    • M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, "Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution," Nano Lett. 6, 1307-1310 (2006).
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  • 12
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    • L. Diehl, D. Bour, S. Corzine, J. Zhu, G. Höfler, M. Lončar, M. Troccoli, and F. Capasso, High-temperature continuous wave operation of strain-balanced quantum cascade lasers grown by metal organic vapor-phase epitaxy, Appl. Phys. Lett. 89, 08.1101 (2006).
    • L. Diehl, D. Bour, S. Corzine, J. Zhu, G. Höfler, M. Lončar, M. Troccoli, and F. Capasso, "High-temperature continuous wave operation of strain-balanced quantum cascade lasers grown by metal organic vapor-phase epitaxy," Appl. Phys. Lett. 89, 08.1101 (2006).
  • 13
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    • Room temperature continuous-wave operation, of quantum-cascade lasers grown by metal, organic vapour phase epitaxy
    • M. Troccoli, S. Corzine, D. Bour, J. Zhu, O. Assayag, L. Diehl, B. G. Lee, G. Hofler, and F. Capasso, "Room temperature continuous-wave operation, of quantum-cascade lasers grown by metal, organic vapour phase epitaxy," Electron. Lett. 41, 1059-1060 (2005).
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    • Troccoli, M.1    Corzine, S.2    Bour, D.3    Zhu, J.4    Assayag, O.5    Diehl, L.6    Lee, B.G.7    Hofler, G.8    Capasso, F.9
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    • The complex refractive index of the active region, is calculated by taking the weighted average of the complex refractive indexes of the two constituent materials (AlInAs and InGaAs). This is a good approximation because the wavelength in. the laser material is significantly larger than, the thickness of each individual material layer (typically 1-4 nm).
    • The complex refractive index of the active region, is calculated by taking the weighted average of the complex refractive indexes of the two constituent materials (AlInAs and InGaAs). This is a good approximation because the wavelength in. the laser material is significantly larger than, the thickness of each individual material layer (typically 1-4 nm).
  • 17
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    • Self-consistent modeling of beam instabilities in 980-nm fiber pump lasers
    • G. L. Tan, R. S. Mand, and J. M. Xu, "Self-consistent modeling of beam instabilities in 980-nm fiber pump lasers," IEEE J. Quantum Electron. 33, 1384-1395 (1997).
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    • Tan, G.L.1    Mand, R.S.2    Xu, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.