Kinetic length and step permeability on the Si(1 1 1) (1 × 1) surface

Surface Science

Volumn 601, Issue 20 SPEC. ISS., 2007, Pages 4669-4674

  Man, K L ^a   Pang, A B ^a   Altman, M S ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Low energy electron microscopy (LEEM); Silicon; Surface diffusion; Surface morphology; Surface step kinetics

Indexed keywords

COMPUTATIONAL GEOMETRY; REACTION KINETICS; SILICON; SURFACE DIFFUSION;

LOW-ENERGY ELECTRON MICROSCOPY (LEEM); SURFACE STEP KINETICS;

SURFACE MORPHOLOGY;

EID: 35148830379     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.039     Document Type: Article

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