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http://www.cree.com
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http://www.nitronex.com
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A GaN HFET Device Technology on 3 SiC Substrates for Wireless Infrastructure Applications
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B.M. Green, H. Henry, J. Selbee, R. Lawrence, K. Moore, J. Abdou, M. Miller, "A GaN HFET Device Technology on 3" SiC Substrates for Wireless Infrastructure Applications," 2006 IEEE MTT-S Int. Microwave Symp. Dig.pp. 706-709, June 2006
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370-W Output Power GaN-FET Amplifier with Low Distortion for W-CDMA Base Stations
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June
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Akio Wakejima, Kohji Matsunaga, Yasuhiro Okamoto, Kazuld Ota, Yuji Ando, Tatsuo Nakayama, and Hironobu Miyamoto, "370-W Output Power GaN-FET Amplifier with Low Distortion for W-CDMA Base Stations," 2006 IEEE MIT-S Int. Microwave Symp. Dig.pp. 1360-1363, June 2006
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Linearity and Efficiency Performance of GaN HEMTs with Digital Pre-Distortion Correction
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June
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M.J. Poulton, W. K. Leverich, J.B. Shealy, R. Vetury, J.D. Brown, D.S. Green, S.R. Gibb, "Linearity and Efficiency Performance of GaN HEMTs with Digital Pre-Distortion Correction," ," 2006 IEEE MTT-S Int. Microwave Symp. Dig.pp. 1327-1330, June 2006
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Performance of AlGaN/GaN HFETs Fabricated on 100mm Silicon Substrates for Wireless Basestation Applications
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June
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J.D. Brown, W. Nagy, S. Singhal, S. Peters, A.Chaudhari, T. Li, R. Nichols, R. Borges, P. Rajagopal, J.W. Johnson, R.J. Therrien, A.W. Hanson, A. Vescan, "Performance of AlGaN/GaN HFETs Fabricated on 100mm Silicon Substrates for Wireless Basestation Applications." 2004 IEEE MTT-S Int. Microwave Symp. Dig.pp. S33-S36. June 2004
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9
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Bias Dependent Performance of High-Power AlGaN/GaN HEMTs
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Performance. Reliability, and Manufacturability of AlGaN/GaN High Electron Mobility Transistors on Silicon Carbide Substrates
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J.D. Brown, D.S.Green, S.R. Gibb, J.B. Shealy, J. McKenna, M. Poulton, S. Lee, K.Gratzer, B. Hosse, T. Mercier, Y. Yang, M.G. Young, R. Vetury "Performance. Reliability, and Manufacturability of AlGaN/GaN High Electron Mobility Transistors on Silicon Carbide Substrates". ECS Transactions, vol. 3 no. 5, 2006
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Integrated Micro-Raman/Infrared Thermography Probe for Monitoring of Self-Heating in AlGaN/GaN Transistor Structures
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October
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Andrei Sarua, Hangfeng Ji, Martin Kuball, Michael J. Uren, Trevor Martin. Keith P. Hilton, and Richard S. Balmer, "Integrated Micro-Raman/Infrared Thermography Probe for Monitoring of Self-Heating in AlGaN/GaN Transistor Structures," IEEE Trans. on Electron Dev., pp 2438-2447, vol. 53, no 10, October 2006
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