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Volumn , Issue , 2007, Pages 303-306

Voltage dependent characteristics of 48V AlGaN/GaN high electron mobility transistor technology on silicon carbide

Author keywords

FETs; Gallium compounds; Microwave amplifier; Power amplifiers; Scattering parameters; Semiconductor devices

Indexed keywords

ALUMINUM GALLIUM NITRIDE; GALLIUM NITRIDE; MICROWAVE AMPLIFIERS; OPTIMIZATION; POWER AMPLIFIERS; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICES; SILICON CARBIDE; VOLTAGE MEASUREMENT;

EID: 34748897268     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2007.380412     Document Type: Conference Paper
Times cited : (9)

References (11)
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    • http://www.eudyna.com
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    • 34748917403 scopus 로고    scopus 로고
    • http://www.cree.com
  • 3
    • 34748881631 scopus 로고    scopus 로고
    • http://www.nitronex.com
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    • 34748820393 scopus 로고    scopus 로고
    • http://www.rfmd.com
  • 11
    • 33847358490 scopus 로고    scopus 로고
    • Integrated Micro-Raman/Infrared Thermography Probe for Monitoring of Self-Heating in AlGaN/GaN Transistor Structures
    • October
    • Andrei Sarua, Hangfeng Ji, Martin Kuball, Michael J. Uren, Trevor Martin. Keith P. Hilton, and Richard S. Balmer, "Integrated Micro-Raman/Infrared Thermography Probe for Monitoring of Self-Heating in AlGaN/GaN Transistor Structures," IEEE Trans. on Electron Dev., pp 2438-2447, vol. 53, no 10, October 2006
    • (2006) IEEE Trans. on Electron Dev , vol.53 , Issue.10 , pp. 2438-2447
    • Sarua, A.1    Ji, H.2    Kuball, M.3    Uren, M.J.4    Martin, T.5    Hilton, K.P.6    Balmer, R.S.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.